22-10-2012, 05:08 PM
Agilent 3070 Test Program Set (TPS) Development
ABSTRACT
This report documents the Test Program Set (TPS) development to perform In-Circuit Testing of Ten (10) Circuit Card
Assemblies (CCAs) using the HP3070 test development system. The goal of this effort was to verify that current Air Logistic
Center test system workload could be moved to the HP3070 system. The ten (10) CCAs were test candidates to verify that
the HP3070 test system could repair these CCAs and return the cards to inventory and the return of the cards would prevent
the F-15 from being grounded due to lack of available Line Replaceable Units (LRUs) and Shop Replaceable Units (SRUs).
The successful results of this effort will assist in returning organic capability to the Air Force to repair LRUs and SRUs in a
timely, cost efficient manner.