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Full Version: 3D INTRGRATED CIRCUITS FULLREPORT
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PRESENTED BY:
SHAMITH MANOHAR

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WHAT IS A 3D IC ?
• In electronics, a three-dimensional integrated circuit (3D IC, 3D-IC, or 3-D IC) is a chip in which two or more layers of active electronic component are integrated both vertically and horizontally into a single circuit. The semiconductor industry is hotly pursuing this promising technology in many different forms.
Motivation For 3D IC Design
• INTERCONNECT LIMITED VLSI PERFORMANCE
• Interconnect structures increasingly consume more of the power and delay budgets in modern design.
• Plausible solution: increase the number of “nearest neighbors” seen by each transistor by using 3D IC design
• Smaller wire cross-sections, smaller wire pitch and longer lines to traverse larger chips increase RC delay. RC delay is increasingly becoming the dominant factor
PHYSICAL LIMITATIONS OF Cu INTERCONNECTS
• At 250 nm Cu was introduced alleviate the adverse effect of increasing interconnect delay.130 nm technology node, substantial interconnect delays will result.
• 3-D INTEGRATION (3D NOC).
• Offers an opportunity to continue performance improvements using CMOS technology-Higher integration density.Thus overcoming the barrier of interconnect scaling
3D ARCHITECTURE
• The 3D chip design technology can be exploited to build SoCs by placing circuits with different voltage and performance requirements in different layers.
• The 3D integration can reduce the wiring ,thereby reducing the capacitance, power dissipation and chip area and therefore improve chip performance.
• Additionally the digital and analog components in the mixed-signal systems can be placed on different Si layers thereby achieving better noise performance due to lower electromagnetic interference between such circuits blocks.
• From an integration point of view, mixed-technology assimilation could be made less complex and more cost effective by fabricating such technologies on separate substrates followed by physical bonding.
AREA AND PERFORMANCE ESTIMATION OF 3D ICs
• Rent’s Rule
• 2-D AND 3-D WIRE-LENGTH DISTRIBUTIONS
• ESTIMATING 2-D AND 3-D CHIP AREA
• TWO ACTIVE LAYER 3-D CIRCUIT PERFORMANCE
• EFFECT OF INCREASING NUMBER OF SILICON LAYERS
• EFFECT OF INCREASING THE NUMBER OF METAL LAYERS
• OPTIMIZATION OF INTERCONNECT DISTRIBUTION
CHALLENGES FOR 3-D INTEGRATION
• Thermal Effects dramatically impact interconnect and device reliability in 2D circuits
• Due to reduction in chip size of a 3D implementation, 3D circuits exhibit a sharp increase in power density
• Analysis of Thermal problems in 3D is necessary to evaluate thermal robustness of different 3D technology and design options.
• Heat generated arises due to switching
• In 2D circuits we have only one layer of Si to consider