05-09-2012, 03:24 PM
Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components
[attachment=33448]
Introduction
With increased requirements for size
reduction and higher reliability design
standards, it has been become necessary
to evaluate the contact resistance
and insulation resistance of electromechanical
components such as relays,
switches, and connectors, employed
in electronic equipment. We will
discuss the solutions offered by the
Agilent Technologies 4338B milliohm
meter and the 4339B high resistance
meter which let these measurement
requirements be realized.
Contact Resistance Measurement
1. It is troublesome to determine the
proper measurement range for a
device whose value is unknown.
2. The device can’t be evaluated at
its actual working level (e.g., l μA)
because the test signal level is
a function of the measurement
range selected.
3. It’s impossible to measure high
valued contact resistance (e.g.,
500 Ω of the rubber key).
4. Total throughput isn’t improved,
due to the slow measurement
speed and inadequate control
interfacing to available automatic
handlers.
5. Existing test fixtures can’t be used
to measure small and large diameter
lead components.
[attachment=33448]
Introduction
With increased requirements for size
reduction and higher reliability design
standards, it has been become necessary
to evaluate the contact resistance
and insulation resistance of electromechanical
components such as relays,
switches, and connectors, employed
in electronic equipment. We will
discuss the solutions offered by the
Agilent Technologies 4338B milliohm
meter and the 4339B high resistance
meter which let these measurement
requirements be realized.
Contact Resistance Measurement
1. It is troublesome to determine the
proper measurement range for a
device whose value is unknown.
2. The device can’t be evaluated at
its actual working level (e.g., l μA)
because the test signal level is
a function of the measurement
range selected.
3. It’s impossible to measure high
valued contact resistance (e.g.,
500 Ω of the rubber key).
4. Total throughput isn’t improved,
due to the slow measurement
speed and inadequate control
interfacing to available automatic
handlers.
5. Existing test fixtures can’t be used
to measure small and large diameter
lead components.